12 results
Contrast Mechanisms in Transmission Microscopy Using keV Helium Ions
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- Journal:
- Microscopy and Microanalysis / Volume 28 / Issue S1 / August 2022
- Published online by Cambridge University Press:
- 22 July 2022, pp. 34-35
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- August 2022
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Transmission ion microscopy and time-of-flight spectroscopy
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- Journal:
- Microscopy and Microanalysis / Volume 27 / Issue S1 / August 2021
- Published online by Cambridge University Press:
- 30 July 2021, pp. 1930-1932
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- August 2021
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In-situ Correlative Analysis of electrical and magnetic properties of Ion-beam treated surfaces by combination of AFM and FIB
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- Journal:
- Microscopy and Microanalysis / Volume 27 / Issue S1 / August 2021
- Published online by Cambridge University Press:
- 30 July 2021, p. 1020
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- August 2021
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npSCOPE: A New Instrument Combining SIMS Imaging, SE Imaging and Transmission Ion Microscopy for High Resolution In-situ Correlative Investigations
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- Journal:
- Microscopy and Microanalysis / Volume 26 / Issue S2 / August 2020
- Published online by Cambridge University Press:
- 30 July 2020, pp. 1976-1977
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- August 2020
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In-situ Characterization of MoS2 Based Field Effect Transistors during Ion Irradiation
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- Journal:
- Microscopy and Microanalysis / Volume 26 / Issue S2 / August 2020
- Published online by Cambridge University Press:
- 30 July 2020, pp. 294-296
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- August 2020
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Imaging Structure and Magnetisation in New Ways Using 4D STEM
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- Microscopy and Microanalysis / Volume 24 / Issue S1 / August 2018
- Published online by Cambridge University Press:
- 01 August 2018, pp. 180-181
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- August 2018
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Time of Flight Backscatter and Secondary Ion Spectrometry in a Helium Ion Microscope
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- Journal:
- Microscopy and Microanalysis / Volume 24 / Issue S1 / August 2018
- Published online by Cambridge University Press:
- 01 August 2018, pp. 802-803
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- August 2018
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Noble gas ion beams in materials science for future applications and devices
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- MRS Bulletin / Volume 42 / Issue 9 / September 2017
- Published online by Cambridge University Press:
- 08 September 2017, pp. 660-666
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- September 2017
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Developing Rapid and Advanced Visualisation of Magnetic Structures Using 2-D Pixelated STEM Detectors
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- Journal:
- Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
- Published online by Cambridge University Press:
- 25 July 2016, pp. 530-531
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- July 2016
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Nanometer Scale Time of Flight Back Scattering Spectrometry in the Helium Ion Microscope
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- Journal:
- Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
- Published online by Cambridge University Press:
- 25 July 2016, pp. 618-619
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- July 2016
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Tailoring magnetic nanostructures with neon in the ion microscope
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- Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
- Published online by Cambridge University Press:
- 25 July 2016, pp. 1716-1717
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- July 2016
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Self Assembly of Anisotropic Organic Molecules: Diffusion versus Sticking Anisotropy
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- Journal:
- MRS Online Proceedings Library Archive / Volume 901 / 2005
- Published online by Cambridge University Press:
- 26 February 2011, 0901-Ra18-04
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- 2005
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